A new field dependent mobility model for high frequency channel thermal noise of deep submicron RFCMOS

A new field dependent mobility model for high frequency channel thermal noise of deep submicron RFCMOS

In this paper, a new field dependent effective mobility model including the drain-induced vertical field effect (DIVF) is presented to calculate the channel thermal noise of short channel MOSFETs operating at high frequencies. Based on the new channel thermal noise model, the simulated channel therm...

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Bibliographic Details
Main Authors: Ong, Shih Ni, Yeo, Kiat Seng, Chew, Kok Wai Johnny, Chan, L. H. K., Loo, Xi Sung, Boon, Chirn Chye, Do, Manh Anh
Other Authors: School of Electrical and Electronic Engineering
Format: Journal Article
Language:English
Published: 2013
Subjects:
DRNTU::Engineering::Electrical and electronic engineering
Online Access:https://hdl.handle.net/10356/96912
http://hdl.handle.net/10220/10377

Internet

https://hdl.handle.net/10356/96912
http://hdl.handle.net/10220/10377

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