Maximization of SRAM energy efficiency utilizing MTCMOS technology

Higher-Vth devices in the cross-coupled latches and the write access transistors, and lower-Vth devices in the read ports are preferred for reducing leakage current without sacrificing performance. However, at ultra-low supply voltage levels, higher-Vth devices can retard or nullify energy efficienc...

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Detaylı Bibliyografya
Asıl Yazarlar: Wang, Bo, Zhou, Jun, Kim, Tony Tae-Hyoung
Diğer Yazarlar: School of Electrical and Electronic Engineering
Materyal Türü: Conference Paper
Dil:English
Baskı/Yayın Bilgisi: 2013
Konular:
Online Erişim:https://hdl.handle.net/10356/99114
http://hdl.handle.net/10220/12584