Study of charge diffusion at the carbon nanotube-SiO2 interface by electrostatic force microscopy
Hysteresis behavior is observed in the transfer characteristic of most carbon-nanotube-based field effect transistors, and charges trapped at the carbon nanotube−dielectric interface are believed to be the cause. We have studied charge injection and dissipation around the interface of carbon nanotub...
| Main Authors: | , , , , , |
|---|---|
| Other Authors: | |
| Format: | Journal Article |
| Language: | English |
| Published: |
2011
|
| Subjects: | |
| Online Access: | https://hdl.handle.net/10356/99831 http://hdl.handle.net/10220/7418 |