Study of charge diffusion at the carbon nanotube-SiO2 interface by electrostatic force microscopy
Hysteresis behavior is observed in the transfer characteristic of most carbon-nanotube-based field effect transistors, and charges trapped at the carbon nanotube−dielectric interface are believed to be the cause. We have studied charge injection and dissipation around the interface of carbon nanotub...
| Principais autores: | , , , , , |
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| Outros Autores: | |
| Formato: | Journal Article |
| Idioma: | English |
| Publicado em: |
2011
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| Assuntos: | |
| Acesso em linha: | https://hdl.handle.net/10356/99831 http://hdl.handle.net/10220/7418 |