White-light-induced disruption of nanoscale conducting filament in hafnia
Nanoscale conducting filament, which forms the basis of the HfO2 resistive memory, is shown to exhibit a “negative photoconductivity” behavior, in that, electrical conduction through it can be disrupted upon white-light illumination. This behavior should be contrasted against the positive photocondu...
| मुख्य लेखकों: | , , , , , , |
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| अन्य लेखक: | |
| स्वरूप: | Journal Article |
| भाषा: | English |
| प्रकाशित: |
2015
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| ऑनलाइन पहुंच: | https://hdl.handle.net/10356/99990 http://hdl.handle.net/10220/38678 |