The effect of pattern overlap on the accuracy of high resolution electron backscatter diffraction measurements.
High resolution, cross-correlation-based, electron backscatter diffraction (EBSD) measures the variation of elastic strains and lattice rotations from a reference state. Regions near grain boundaries are often of interest but overlap of patterns from the two grains could reduce accuracy of the cross...
| मुख्य लेखकों: | , , , |
|---|---|
| स्वरूप: | Journal article |
| भाषा: | English |
| प्रकाशित: |
Elsevier
2015
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