Hybrid statistics-simulations based method for atom-counting from ADF STEM images
A hybrid statistics-simulations based method for atom-counting from annular dark field scanning transmission electron microscopy (ADF STEM) images of monotype crystalline nanostructures is presented. Different atom-counting methods already exist for model-like systems. However, the increasing releva...
| Main Authors: | , , , , |
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| Format: | Journal article |
| Published: |
Elsevier
2017
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