The benefits of energy-filtering in weak-beam microscopy
We have explored systematically the benefits of energy filtering to remove inelastically-scattered electrons with energy losses greater than about 10 eV from weak-beam images of dislocations. Digital weak-beam images were obtained of long dislocations in Ni3Ga using a Gatan Imaging Filter attached t...
| Main Authors: | , , , |
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| Format: | Conference item |
| Published: |
2003
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