The benefits of energy-filtering in weak-beam microscopy
We have explored systematically the benefits of energy filtering to remove inelastically-scattered electrons with energy losses greater than about 10 eV from weak-beam images of dislocations. Digital weak-beam images were obtained of long dislocations in Ni3Ga using a Gatan Imaging Filter attached t...
| Main Authors: | , , , |
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| Format: | Conference item |
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2003
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| _version_ | 1797050447956017152 |
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| author | Jenkins, M Martin, S Hetherington, C Kirk, M |
| author_facet | Jenkins, M Martin, S Hetherington, C Kirk, M |
| author_sort | Jenkins, M |
| collection | OXFORD |
| description | We have explored systematically the benefits of energy filtering to remove inelastically-scattered electrons with energy losses greater than about 10 eV from weak-beam images of dislocations. Digital weak-beam images were obtained of long dislocations in Ni3Ga using a Gatan Imaging Filter attached to a Jeol 3000F FEGTEM. The image quality was assessed in terms of three parameters: the image peak width; the peak-to-background ratio; and the signal-to-noise ratio. All three of these measures were significantly improved in "zero-loss" energy-filtered images compared with unfiltered images taken under the same imaging conditions particularly in thick areas of foil (> 100 nm), where unfiltered images were badly degraded by chromatic aberration. In a foil of thickness similar to180nm energy-filtered images were of comparable quality to those obtainable in thin areas of foil (< 50 nm). |
| first_indexed | 2024-03-06T18:05:18Z |
| format | Conference item |
| id | oxford-uuid:013d8101-4e62-46af-834d-28838210e674 |
| institution | University of Oxford |
| last_indexed | 2024-03-06T18:05:18Z |
| publishDate | 2003 |
| record_format | dspace |
| spelling | oxford-uuid:013d8101-4e62-46af-834d-28838210e6742022-03-26T08:33:48ZThe benefits of energy-filtering in weak-beam microscopyConference itemhttp://purl.org/coar/resource_type/c_5794uuid:013d8101-4e62-46af-834d-28838210e674Symplectic Elements at Oxford2003Jenkins, MMartin, SHetherington, CKirk, MWe have explored systematically the benefits of energy filtering to remove inelastically-scattered electrons with energy losses greater than about 10 eV from weak-beam images of dislocations. Digital weak-beam images were obtained of long dislocations in Ni3Ga using a Gatan Imaging Filter attached to a Jeol 3000F FEGTEM. The image quality was assessed in terms of three parameters: the image peak width; the peak-to-background ratio; and the signal-to-noise ratio. All three of these measures were significantly improved in "zero-loss" energy-filtered images compared with unfiltered images taken under the same imaging conditions particularly in thick areas of foil (> 100 nm), where unfiltered images were badly degraded by chromatic aberration. In a foil of thickness similar to180nm energy-filtered images were of comparable quality to those obtainable in thin areas of foil (< 50 nm). |
| spellingShingle | Jenkins, M Martin, S Hetherington, C Kirk, M The benefits of energy-filtering in weak-beam microscopy |
| title | The benefits of energy-filtering in weak-beam microscopy |
| title_full | The benefits of energy-filtering in weak-beam microscopy |
| title_fullStr | The benefits of energy-filtering in weak-beam microscopy |
| title_full_unstemmed | The benefits of energy-filtering in weak-beam microscopy |
| title_short | The benefits of energy-filtering in weak-beam microscopy |
| title_sort | benefits of energy filtering in weak beam microscopy |
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