Strain measurement using electron back scatter diffraction

類似資料

• Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.
  著者:: Wilkinson, A
  出版事項: (1996)
• Mapping strains at the nanoscale using electron back scatter diffraction
  著者:: Wilkinson, A, 等
  出版事項: (2009)
• Measurement of small misorientations using electron back scatter diffraction
  著者:: Wilkinson, A
  出版事項: (1999)
• Strain tensor mapping at the nanoscale using electron back scatter diffraction
  著者:: Wilkinson, A, 等
  出版事項: (2006)
• Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction
  著者:: Wilkinson, A
  出版事項: (2011)