Strain measurement using electron back scatter diffraction

Παρόμοια τεκμήρια

• Mapping strains at the nanoscale using electron back scatter diffraction
  ανά: Wilkinson, A, κ.ά.
  Έκδοση: (2009)
• Measurement of elastic strains and small lattice rotations using electron back scatter diffraction.
  ανά: Wilkinson, A
  Έκδοση: (1996)
• Strain tensor mapping at the nanoscale using electron back scatter diffraction
  ανά: Wilkinson, A, κ.ά.
  Έκδοση: (2006)
• Measurement of small misorientations using electron back scatter diffraction
  ανά: Wilkinson, A
  Έκδοση: (1999)
• Assessment of lattice strain, rotation and dislocation content using electron back-scatter diffraction
  ανά: Wilkinson, A
  Έκδοση: (2011)