Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
Language
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
STUDIES OF LATTICE-DEFECTS USI...
Cite this
Text this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Permanent link
STUDIES OF LATTICE-DEFECTS USING WEAK DIFFRACTED BEAMS
Bibliographic Details
Main Authors:
Cockayne, D
,
Gomez, A
,
Holmes, S
Format:
Journal article
Published:
1975
Holdings
Description
Similar Items
Staff View
Similar Items
WEAK-BEAM ELECTRON-MICROSCOPY
by: Cockayne, D
Published: (1981)
DISLOCATIONS IN SEMICONDUCTORS AS STUDIED BY WEAK-BEAM ELECTRON-MICROSCOPY
by: Cockayne, D, et al.
Published: (1979)
Applications of the weak beam technique of electron microscopy
by: Cockayne, D
Published: (1999)
THEORETICAL ANALYSIS OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
by: Cockayne, D
Published: (1972)
PRINCIPLES AND PRACTICE OF WEAK-BEAM METHOD OF ELECTRON-MICROSCOPY
by: Cockayne, D
Published: (1973)