Nanostructural features of a spider dragline silk as revealed by electron and X-ray diffraction studies
Transmission electron microscopy (TEM) and X-ray diffraction (XRD) were used to examine the nanostructure of a natural polymer-a spider dragline silk-that has potential applications as an engineering material. The silk studied was collected from the cob-web weaving spider Latrodectus hesperus. Singl...
| Main Authors: | , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2006
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