Intra-gate fault diagnosis of CMOS integrated circuits
<p>Knowing the root cause of why an Integrated Circuit (1C) device fails to function properly is the key to provide the corrective measures to increase the yield and shorten the time to market. In recent years, electrical fault diagnosis method has received growing attention due to the effect...
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| Format: | Thesis |
| Language: | English |
| Published: |
2006
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| Subjects: |