Count, crop and recognise: fine-grained recognition in the wild
| Main Authors: | , , , |
|---|---|
| Format: | Conference item |
| Language: | English |
| Published: |
IEEE Xplore
2020
|
| Main Authors: | , , , |
|---|---|
| Format: | Conference item |
| Language: | English |
| Published: |
IEEE Xplore
2020
|