Count, crop and recognise: fine-grained recognition in the wild
Main Authors: | , , , |
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Format: | Conference item |
Language: | English |
Published: |
IEEE Xplore
2020
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Summary: |
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Main Authors: | , , , |
---|---|
Format: | Conference item |
Language: | English |
Published: |
IEEE Xplore
2020
|
Summary: |
---|