Atomic and electronic structure of grain boundaries in gallium arsenide
<p>HREM imaging was performed using the Jeol 4000ex microscope on specimens prepared from an as-grown ingot of semi-insulating Gallium Arsenide. Various low angle grain boundaries were imaged in the [110] orientation, misorientations varying between 4°-13°. Detailed study of a grain boundary...
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| Formato: | Tese |
| Idioma: | English |
| Publicado em: |
1994
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