Direct imaging of rotational stacking faults in few layer graphene

Direct imaging of rotational stacking faults in few layer graphene

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Few layer graphene nanostructures are directiy imaged using aberration corrected high-resolution transmission electron microscopy with an electron accelerating voltage of 80 kV. We observe rotational stacking faults in the HRTEM images of 2-6 layers of graphene sheets, giving rise to Moiré patterns....

Podrobná bibliografie
Hlavní autoři:	Warner, J, Rümmeli, M, Gemming, T, Büchner, B, Briggs, G
Médium:	Journal article
Jazyk:	English
Vydáno:	2009

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