Direct imaging of rotational stacking faults in few layer graphene
Few layer graphene nanostructures are directiy imaged using aberration corrected high-resolution transmission electron microscopy with an electron accelerating voltage of 80 kV. We observe rotational stacking faults in the HRTEM images of 2-6 layers of graphene sheets, giving rise to Moiré patterns....
Egile Nagusiak: | Warner, J, Rümmeli, M, Gemming, T, Büchner, B, Briggs, G |
---|---|
Formatua: | Journal article |
Hizkuntza: | English |
Argitaratua: |
2009
|
Antzeko izenburuak
-
Direct imaging of rotational stacking faults in few layer graphene.
nork: Warner, J, et al.
Argitaratua: (2009) -
Structural distortions in few-layer graphene creases.
nork: Robertson, A, et al.
Argitaratua: (2011) -
Atomic structure of interconnected few-layer graphene domains.
nork: Robertson, A, et al.
Argitaratua: (2011) -
Atomic resolution imaging of the edges of catalytically etched suspended few-layer graphene.
nork: Schäffel, F, et al.
Argitaratua: (2011) -
Atomic resolution imaging of the edges of catalytically etched suspended few-layer graphene
nork: Schäffel, F, et al.
Argitaratua: (2011)