Direct imaging of rotational stacking faults in few layer graphene

Direct imaging of rotational stacking faults in few layer graphene

Taispeáin leaganacha eile (1)

Few layer graphene nanostructures are directiy imaged using aberration corrected high-resolution transmission electron microscopy with an electron accelerating voltage of 80 kV. We observe rotational stacking faults in the HRTEM images of 2-6 layers of graphene sheets, giving rise to Moiré patterns....

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Sonraí bibleagrafaíochta
Príomhchruthaitheoirí:	Warner, J, Rümmeli, M, Gemming, T, Büchner, B, Briggs, G
Formáid:	Journal article
Teanga:	English
Foilsithe / Cruthaithe:	2009

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