Direct imaging of rotational stacking faults in few layer graphene
Few layer graphene nanostructures are directiy imaged using aberration corrected high-resolution transmission electron microscopy with an electron accelerating voltage of 80 kV. We observe rotational stacking faults in the HRTEM images of 2-6 layers of graphene sheets, giving rise to Moiré patterns....
| Egile Nagusiak: | , , , , |
|---|---|
| Formatua: | Journal article |
| Hizkuntza: | English |
| Argitaratua: |
2009
|
Search Result 1
Direct imaging of rotational stacking faults in few layer graphene.
Argitaratua 2009
Journal article