Direct imaging of rotational stacking faults in few layer graphene
Few layer graphene nanostructures are directiy imaged using aberration corrected high-resolution transmission electron microscopy with an electron accelerating voltage of 80 kV. We observe rotational stacking faults in the HRTEM images of 2-6 layers of graphene sheets, giving rise to Moiré patterns....
| मुख्य लेखकों: | , , , , |
|---|---|
| स्वरूप: | Journal article |
| भाषा: | English |
| प्रकाशित: |
2009
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