Deterministic electron ptychography at atomic resolution

We present a fast deterministic approach to the ptychographic reconstruction of the transmission function of a specimen at atomic resolution. The method is demonstrated using a data set obtained from a cerium dioxide nanoparticle using an aberration-corrected electron microscope and is compared to e...

詳細記述

書誌詳細
主要な著者: D'Alfonso, A, Morgan, A, Yan, A, Wang, P, Sawada, H, Kirkland, A, Allen, L
フォーマット: Journal article
言語:English
出版事項: 2014