A sub-micron resolution, bunch-by-bunch beam trajectory feedback system and its application to reducing wakefield effects in single-pass beamline

A sub-micron resolution, bunch-by-bunch beam trajectory feedback system and its application to reducing wakefield effects in single-pass beamline

A high-precision intra-bunch-train beam orbit feedback correction system has been developed and tested in the ATF2 beamline of the Accelerator Test Facility at the High Energy Accelerator Research Organization in Japan. The system uses the vertical position of the bunch measured at two beam position...

書誌詳細
主要な著者:	Bett, DR, Burrows, PN, Perry, C, Ramjiawan, R, Terunuma, N, Kubo, K, Okugi, T
フォーマット:	Journal article
言語:	English
出版事項:	IOP Publishing 2022

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