Advanced strain analysis by high energy synchrotron X-ray diffraction
Diffraction experiments using high energy, high intensity synchrotron X-ray beams are a powerful method of compiling two or three-dimensional orientation and phase-specific scans of the lattice parameter. This information can be converted into strain and stress maps of high accuracy and resolution,...
| Hoofdauteurs: | , |
|---|---|
| Formaat: | Journal article |
| Taal: | English |
| Gepubliceerd in: |
Trans Tech Publications
2002
|
| Onderwerpen: |