Advanced strain analysis by high energy synchrotron X-ray diffraction

Diffraction experiments using high energy, high intensity synchrotron X-ray beams are a powerful method of compiling two or three-dimensional orientation and phase-specific scans of the lattice parameter. This information can be converted into strain and stress maps of high accuracy and resolution,...

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Detaylı Bibliyografya
Asıl Yazarlar: Korsunsky, A, James, K
Materyal Türü: Journal article
Dil:English
Baskı/Yayın Bilgisi: Trans Tech Publications 2002
Konular: