Advanced strain analysis by high energy synchrotron X-ray diffraction
Diffraction experiments using high energy, high intensity synchrotron X-ray beams are a powerful method of compiling two or three-dimensional orientation and phase-specific scans of the lattice parameter. This information can be converted into strain and stress maps of high accuracy and resolution,...
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| פורמט: | Journal article |
| שפה: | English |
| יצא לאור: |
Trans Tech Publications
2002
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| נושאים: |