Advanced strain analysis by high energy synchrotron X-ray diffraction
Diffraction experiments using high energy, high intensity synchrotron X-ray beams are a powerful method of compiling two or three-dimensional orientation and phase-specific scans of the lattice parameter. This information can be converted into strain and stress maps of high accuracy and resolution,...
| 主要な著者: | , |
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| フォーマット: | Journal article |
| 言語: | English |
| 出版事項: |
Trans Tech Publications
2002
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