The effect of radiation damage on anomalous absorption in the TEM
In-situ electron irradiation of Si at 400keV was performed to determine the variation of two-beam absorption parameters by the method of Hashimoto. Corresponding theoretical sensitivity studies were performed to assess limitations of experimental errors. No significant variations in parameters were...
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| פורמט: | Conference item |
| יצא לאור: |
2004
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