Nanoscale residual stress depth profiling by focused ion beam milling and eigenstrain analysis
Residual stresses play a crucial role in determining material properties and behaviour, in terms of structural integrity under monotonic and cyclic loading, and for functional performance, in terms of capacitance, conductivity, band gap, and other characteristics. The methods for experimental residu...
| Κύριοι συγγραφείς: | , , , , , , , , |
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| Μορφή: | Journal article |
| Έκδοση: |
Elsevier
2018
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