Measurement of residual elastic strain and lattice rotations with high resolution electron backscatter diffraction.
A set of dynamically simulated electron backscatter patterns (EBSPs) for α-Ti crystals progressively rotated by 1° steps were analysed using cross-correlation to determine image shifts from which strains and rotations were calculated. At larger rotations the cross-correlation fails in certain region...
| Автори: | , |
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| Формат: | Journal article |
| Мова: | English |
| Опубліковано: |
2011
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