AFM studies of polypyrrole film surface morphology - II. Roughness characterization by the fractal dimension analysis
The fractal dimension of electrogenerated polypyrrole films with chloride, sulfate, perchlorate and dodecylsulfate (DDS) anions as dopants is investigated by using atomic force microscopy under ex situ conditions. The results for films both as-prepared and after potentiodynamic cycling in various su...
Hoofdauteurs: | Silk, T, Hong, Q, Tamm, J, Compton, R |
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Formaat: | Journal article |
Taal: | English |
Gepubliceerd in: |
1998
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