Simulated TEM imaging of a heavily irradiated metal
We recast the Howie–Whelan equations for generating simulated transmission electron microscope (TEM) images, replacing the dependence on local atomic displacements with atomic positions only. This allows rapid computation of simulated TEM images for arbitrarily complex atomistic configurations of la...
| Main Authors: | , , , , , , |
|---|---|
| Format: | Journal article |
| Language: | English |
| Published: |
Elsevier
2024
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