Simulated TEM imaging of a heavily irradiated metal

Simulated TEM imaging of a heavily irradiated metal

We recast the Howie–Whelan equations for generating simulated transmission electron microscope (TEM) images, replacing the dependence on local atomic displacements with atomic positions only. This allows rapid computation of simulated TEM images for arbitrarily complex atomistic configurations of la...

Bibliografski detalji
Glavni autori:	Mason, DR, Boleininger, M, Haley, J, Prestat, E, He, G, Hofmann, F, Dudarev, SL
Format:	Journal article
Jezik:	English
Izdano:	Elsevier 2024

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