Applications of deep learning in electron microscopy

We review the growing use of machine learning in electron microscopy (EM) driven in part by the availability of fast detectors operating at kiloHertz frame rates leading to large data sets that cannot be processed using manually implemented algorithms. We summarize the various network architectures...

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Những tác giả chính: Treder, KP, Huang, C, Kim, JS, Kirkland, AI
Định dạng: Journal article
Ngôn ngữ:English
Được phát hành: Oxford University Press 2022