Applications of deep learning in electron microscopy

We review the growing use of machine learning in electron microscopy (EM) driven in part by the availability of fast detectors operating at kiloHertz frame rates leading to large data sets that cannot be processed using manually implemented algorithms. We summarize the various network architectures...

Повний опис

Бібліографічні деталі
Автори: Treder, KP, Huang, C, Kim, JS, Kirkland, AI
Формат: Journal article
Мова:English
Опубліковано: Oxford University Press 2022