SIMcheck: a toolbox for successful super-resolution structured illumination microscopy

Three-dimensional structured illumination microscopy (3D-SIM) is a versatile and accessible method for super-resolution fluorescence imaging, but generating high-quality data is challenging, particularly for non-specialist users. We present SIMcheck, a suite of ImageJ plugins enabling users to ident...

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Detalhes bibliográficos
Main Authors: Ball, G, Demmerle, J, Kaufmann, R, Davis, I, Dobbie, I, Schermelleh, L
Formato: Journal article
Idioma:English
Publicado em: Nature Publishing Group 2015