Imaging and quantifying carrier collection in silicon solar cells: a submicron study using electron beam induced current
In this work electron-beam-induced current (EBIC) is used to study the collection efficiency of emitters in industrial silicon solar cells. Laser-doped local emitters have been deployed industrially, yet in mas production they are designed wider than the screen-printed silver fingers to allow alignm...
| Hoofdauteurs: | , , , , , , , |
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| Formaat: | Journal article |
| Taal: | English |
| Gepubliceerd in: |
Elsevier
2020
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