A new method for determining small misorientations from electron back scatter diffraction patterns
Electron back scatter diffraction (EBSD) was used to measure the local small misorientations due to the accumulation of dislocations within crystals. A new analysis method is presented in which misorientations are measured directly by using cross-correlation methods to determine the relative positio...
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| Format: | Journal article |
| Language: | English |
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2001
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