QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON

Míreanna comhchosúla

• QUANTITATIVE EBIC INVESTIGATIONS OF DEFORMATION-INDUCED AND COPPER DECORATED DISLOCATIONS IN SILICON
  de réir: Fell, T, et al.
  Foilsithe / Cruthaithe: (1991)
• EBIC INVESTIGATIONS OF DISLOCATIONS AND THEIR INTERACTIONS WITH IMPURITIES IN SILICON
  de réir: Fell, T, et al.
  Foilsithe / Cruthaithe: (1993)
• AN EBIC INVESTIGATION OF ALPHA, BETA AND SCREW DISLOCATIONS IN GALLIUM-ARSENIDE
  de réir: Galloway, S, et al.
  Foilsithe / Cruthaithe: (1993)
• An SEM EBIC study of the electronic properties of dislocations in silicon
  de réir: Wilshaw, P, et al.
  Foilsithe / Cruthaithe: (1984)
• THE TEMPERATURE-DEPENDENCE OF EBIC CONTRAST FROM INDIVIDUAL DISLOCATIONS IN SILICON
  de réir: Ourmazd, A, et al.
  Foilsithe / Cruthaithe: (1983)