Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
Language
All Fields
Title
Author
Subject
Call Number
ISBN/ISSN
Tag
Find
Advanced
USING ELNES WITH PARALLEL EELS...
Cite this
Text this
Email this
Print
Export Record
Export to RefWorks
Export to EndNoteWeb
Export to EndNote
Permanent link
USING ELNES WITH PARALLEL EELS FOR DIFFERENTIATING BETWEEN A-SI-X THIN-FILMS
Bibliographic Details
Main Authors:
Auchterlonie, G
,
Mckenzie, D
,
Cockayne, D
Format:
Journal article
Published:
1989
Holdings
Description
Similar Items
Staff View
Similar Items
ELECTRON-DIFFRACTION ANALYSIS OF POLYCRYSTALLINE AND AMORPHOUS THIN-FILMS
by: Cockayne, D, et al.
Published: (1988)
ELECTRON-DIFFRACTION ANALYSIS OF POLYCRYSTALLINE AND AMORPHOUS THIN-FILMS
by: Cockayne, D, et al.
Published: (1988)
ELECTRON-DIFFRACTION ANALYSIS OF POLYCRYSTALLINE AND AMORPHOUS THIN-FILMS
by: Cockayne, D, et al.
Published: (1988)
SPATIAL VARIATIONS IN THE STOICHIOMETRY OF SPUTTERED YBACUO THIN-FILMS - THEORY AND EXPERIMENT
by: Turner, G, et al.
Published: (1990)
Modelling of crystalline C-60 EEL spectra
by: Nicholls, R, et al.
Published: (2006)