Applying grazing incidence X-ray reflectometry (XRR) to characterising nanofilms on mica.
Molecularly smooth mica has hitherto not been widely used as a substrate for the X-ray reflectometry (XRR) technique. That is largely due to the difficulty of achieving flatness over a sufficiently large area of mica. Here we show that this difficulty can be overcome by slightly bending the mica sub...
| Main Authors: | , , , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
2007
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