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Aberration-Corrected Imaging i...
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Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
Detalles Bibliográficos
Main Authors:
Kirkland, A
,
Nellist, P
,
Chang, L
,
Haigh, S
Formato:
Journal article
Publicado:
2008
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