Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

מידע ביבליוגרפי
Main Authors:	Kirkland, A, Nellist, P, Chang, L, Haigh, S
פורמט:	Journal article
יצא לאור:	2008

פריטים דומים

Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
מאת: Kirkland, A, et al.
יצא לאור: (2008)

Progress in aberration-corrected scanning transmission electron microscopy.
מאת: Dellby, N, et al.
יצא לאור: (2001)

Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
מאת: Nellist, P, et al.
יצא לאור: (2008)

Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy
מאת: Cosgriff, E, et al.
יצא לאור: (2008)

Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope
מאת: Nellist, P, et al.
יצא לאור: (2008)

Energy Filtered Scanning Confocal Electron Microscopy in a Double Aberration-Corrected Transmission Electron Microscope
מאת: Wang, P, et al.
יצא לאור: (2009)

Transmission electron microscopy without aberrations: Applications to materials science
מאת: Kirkland, A, et al.
יצא לאור: (2008)

Image Contrast in Aberration-Corrected Scanning Confocal Electron Microscopy
מאת: Cosgriff, E, et al.
יצא לאור: (2010)

Experimental Setup for Energy-Filtered Scanning Confocal Electron Microscopy (EFSCEM) in a Double Aberration-Corrected Transmission Electron Microscope
מאת: Wang, P, et al.
יצא לאור: (2010)

Nanoscale energy-filtered scanning confocal electron microscopy using a double-aberration-corrected transmission electron microscope.
מאת: Wang, P, et al.
יצא לאור: (2010)

Bright-field scanning confocal electron microscopy using a double aberration-corrected transmission electron microscope.
מאת: Wang, P, et al.
יצא לאור: (2011)

Scanning transmission electron microscopy : imaging and analysis /
מאת: Pennycook, Stephen J., et al.
יצא לאור: (2011)

New possibilities with aberration-corrected electron microscopy.
מאת: Cockayne, D, et al.
יצא לאור: (2009)

Z-contrast scanning transmission electron microscopy
מאת: Pennycook, S, et al.
יצא לאור: (1999)

Image formation mechanisms in three-dimensional aberration-corrected scanning transmission electron microscopy
מאת: Cosgriff, EC
יצא לאור: (2008)

Three-dimensional imaging by optical sectioning in the aberration-corrected scanning transmission electron microscope.
מאת: Behan, G, et al.
יצא לאור: (2009)

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part I: elastic scattering.
מאת: Cosgriff, E, et al.
יצא לאור: (2008)

Three-dimensional imaging in double aberration-corrected scanning confocal electron microscopy, part II: inelastic scattering.
מאת: D'Alfonso, A, et al.
יצא לאור: (2008)

High-resolution imaging of zeolite with aberration-corrected transmission electron microscopy
מאת: Kaname Yoshida, et al.
יצא לאור: (2013-04-01)

Z-contrast Imaging in an Aberration-corrected Scanning Transmission Electron Microscope.
מאת: Pennycook, S, et al.
יצא לאור: (2000)

Atomic-scale imaging of electron sensitive zeolites with aberration corrected transmission electron microscopy
מאת: Kaname Yoshida, et al.
יצא לאור: (2023-12-01)

Three-dimensional imaging and analysis by optical sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscopes
מאת: Nellist, P, et al.
יצא לאור: (2008)

Aberration correction for low voltage optimized transmission electron microscopy
מאת: Jaromír Bačovský
יצא לאור: (2018-01-01)

"Indirect" high-resolution transmission electron microscopy: Aberration measurement and wavefunction reconstruction
מאת: Kirkland, A, et al.
יצא לאור: (2004)

"Indirect" high-resolution transmission electron microscopy: aberration measurement and wavefunction reconstruction.
מאת: Kirkland, A, et al.
יצא לאור: (2004)

Indirect transmission electron microscopy; Aberration measurement and compensation and exit wave reconstruction
מאת: Kirkland, A, et al.
יצא לאור: (2004)

Scanning and transmission electron microscopy : an introduction /
מאת: Flegler, Stanley L., et al.
יצא לאור: ([199)

Three-dimensional analysis of nanoparticles on carbon support using aberration-corrected scanning confocal electron microscopy
מאת: Hashimoto, A, et al.
יצא לאור: (2012)

Correlative transmission electron microscopy and scanning electron microscopy of rabbit cornea.
מאת: Othman, Fauziah, et al.
יצא לאור: (2010)

Aberration-corrected transmission electron microscopy of a non-graphitizing carbon
מאת: Allen, CS, et al.
יצא לאור: (2022)

The advantages of sub-sampling and Inpainting for scanning transmission electron microscopy
מאת: Browning, ND, et al.
יצא לאור: (2023)

Optical depth sectioning in the aberration-corrected scanning transmission and scanning confocal electron microscope
מאת: Behan, G, et al.
יצא לאור: (2008)

Atomic-level handedness determination of chiral crystals using aberration-corrected scanning transmission electron microscopy
מאת: Zhuoya Dong, et al.
יצא לאור: (2020-03-01)

Materials advances through aberration-corrected electron microscopy
מאת: Pennycook, S, et al.
יצא לאור: (2006)

Materials advances through aberration-corrected electron microscopy
מאת: Pennycook, S, et al.
יצא לאור: (2006)

Exceeding conventional resolution limits in high-resolution transmission electron microscopy using tilted illumination and exit-wave restoration.
מאת: Haigh, S, et al.
יצא לאור: (2010)

Transmission and scanning electron microscopy of cutis rhomboidalis
מאת: Ângela Faistauer Torre, et al.
יצא לאור: (2021-07-01)

Real-space measurements of bonding charge density in aberration-corrected high resolution electron microscopy
מאת: Ciston, J, et al.
יצא לאור: (2009)

Robotic fabrication of high-quality lamellae for aberration-corrected transmission electron microscopy
מאת: Hideyo Tsurusawa, et al.
יצא לאור: (2021-11-01)

Three-dimensional optical transfer functions in the aberration-corrected scanning transmission electron microscope.
מאת: Jones, L, et al.
יצא לאור: (2014)