Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

Библиографические подробности
Главные авторы:	Kirkland, A, Nellist, P, Chang, L, Haigh, S
Формат:	Journal article
Опубликовано:	2008

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