Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy

Bibliografske podrobnosti
Main Authors:	Kirkland, A, Nellist, P, Chang, L, Haigh, S
Format:	Journal article
Izdano:	2008

Podobne knjige/članki

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