Skip to content
VuFind
English
Deutsch
Español
Français
Italiano
日本語
Nederlands
Português
Português (Brasil)
中文(简体)
中文（繁體）
Türkçe
עברית
Gaeilge
Cymraeg
Ελληνικά
Català
Euskara
Русский
Čeština
Suomi
Svenska
polski
Dansk
slovenščina
اللغة العربية
বাংলা
Galego
Tiếng Việt
Hrvatski
हिंदी
Հայերէն
Українська
Sámegiella
Монгол
语言
全文检索
题名
作者
主题
索引号
ISBN/ISSN
标签
检索
高级检索
Aberration-Corrected Imaging i...
引用
发送短信
推荐此
打印
导出纪录
导出到 RefWorks
导出到 EndNoteWeb
导出到 EndNote
Permanent link
Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
书目详细资料
Main Authors:
Kirkland, A
,
Nellist, P
,
Chang, L
,
Haigh, S
格式:
Journal article
出版:
2008
持有资料
实物特征
相似书籍
职员浏览
相似书籍
Chapter 8 Aberration-Corrected Imaging in Conventional Transmission Electron Microscopy and Scanning Transmission Electron Microscopy
由: Kirkland, A, et al.
出版: (2008)
Progress in aberration-corrected scanning transmission electron microscopy.
由: Dellby, N, et al.
出版: (2001)
Imaging modes for scanning confocal electron microscopy in a double aberration-corrected transmission electron microscope.
由: Nellist, P, et al.
出版: (2008)
Three-dimensional imaging using aberration-corrected scanning transmission and confocal electron microscopy
由: Cosgriff, E, et al.
出版: (2008)
Scanning confocal electron microscopy in a double aberration corrected transmission electron microscope
由: Nellist, P, et al.
出版: (2008)