Mesoscopic scanning tunneling and atomic force microscopy study of the misfit-layer compounds (LaSe)(x)NbSe2 and (PbSe)(x)NbSe2
The surface of the misfit-layer compounds (LaSe)xNbSe2 and (PbSe)xNbSe2 is studied by means of scanning tunneling microscopy (STM) and atomic force microscopy (AFM), in air and nitrogen, in the range of 0.5 to 10 μm2. The cleaved surface of (LaSe)xNbSe2 presents flat non-stepped surfaces which crack...
| Main Authors: | , , , |
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| Format: | Journal article |
| Language: | English |
| Published: |
Elsevier
1999
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