Atomic-scale measurement of composition profiles near growing precipitates in the Cu-Co system

The three-dimensional atom probe can reconstruct the positions of the majority of atoms within a small volume of material to subnanometer resolution. This technique has been used to measure atomic scale composition profiles in the immediate vicinity of nanometer scale precipitates during diffusional...

Täydet tiedot

Bibliografiset tiedot
Päätekijät: Rozdilsky, I, Cerezo, A, Smith, G
Aineistotyyppi: Conference item
Julkaistu: 1998