Atomic-scale measurement of composition profiles near growing precipitates in the Cu-Co system
The three-dimensional atom probe can reconstruct the positions of the majority of atoms within a small volume of material to subnanometer resolution. This technique has been used to measure atomic scale composition profiles in the immediate vicinity of nanometer scale precipitates during diffusional...
Päätekijät: | , , |
---|---|
Aineistotyyppi: | Conference item |
Julkaistu: |
1998
|