Optical Sectioning and Confocal Imaging and Analysis in the Transmission Electron Microscope
Aberration correction in the transmission electron microscope has led to a reduction in the depth of focus for imaging. The depth of focus in a state-of-the-art scanning transmission electron microscope system, which is currently just a few nanometers, creates an opportunity to explore the three-dim...
| Автори: | , |
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| Формат: | Journal article |
| Мова: | English |
| Опубліковано: |
2012
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