OBSERVATION OF INTERFACIAL PLASMONS ON MBE-GROWN GAAS BY HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY
Plasmons at the interface between heavily-doped MBE grown n-type GaAs (n ≅ 4 × 1018 cm-3) and a surface depletion layer about 200 Å thick have been observed by HREELS. The variation of the plasmon frequency and intensity with exciting beam energy are discussed within the framework of a simple two la...
المؤلفون الرئيسيون: | Graygrychowski, Z, Stradling, R, Egdell, R, Dobson, P, Joyce, B, Woodbridge, K |
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التنسيق: | Journal article |
اللغة: | English |
منشور في: |
1986
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مواد مشابهة
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APPLICATION OF HIGH-RESOLUTION ELECTRON-ENERGY-LOSS SPECTROSCOPY TO MBE GROWN GAAS(100)
حسب: Graygrychowski, Z, وآخرون
منشور في: (1987) -
APPLICATION OF HREELS TO MBE-GROWN III-V-MATERIALS
حسب: Graygrychowski, Z, وآخرون
منشور في: (1987) -
Cathodoluminescence study of oval defects in MBE grown InGaAs/GaAs
حسب: RussellHarriott, J, وآخرون
منشور في: (1996) -
A New AlGaAs/GaAs/InGaAs Lasing Switch Grown by MBE
حسب: Ming Rong Lee, وآخرون
منشور في: (2001-01-01) -
SURFACE AND INTERFACE PHONON AND PLASMON EXCITATIONS IN III-V SEMICONDUCTOR-MATERIALS
حسب: Egdell, R, وآخرون
منشور في: (1987)