Determination of the Poisson ratio of (001) and (111) oriented thin films of In2O3 by synchrotron-based x-ray diffraction
The Poisson ratio ν of In 2O 3 has been determined by measurement of the covariation of in-plane and out-of-plane lattice parameters of strained thin films grown epitaxially on (111) and (001) oriented cubic Y-stabilized ZrO 2 substrates. The experimental results are in good agreement with values fo...
| المؤلفون الرئيسيون: | , , , , , , , , |
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| التنسيق: | Journal article |
| اللغة: | English |
| منشور في: |
2011
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